TEM 4 Grid Holder for SEM AFM Imaging and Property Mapping Probes Prod # Description Style Length

Prod # Description Style Length Metal Points - Width x Thickness 5367-7G PELCO® Pro Gold Plated Curved

710 115mm carbon fiber reinforced PVDF 8

on one side and square on the other side

TRmode cantilever holders include dual piezos to oscillate the tip rotationally or vertically

Shown holding a mineral specimen

TEM 4 Grid Holder for SEM AFM Imaging and Property Mapping Probes Prod # Description Style LengthDESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain