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the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
5 Back Angle: 17
Cantilever Material: 0
0 Front Angle: 15 ± 2
7 Cantilever Geometry: Triangular Cantilevers Number: 1 Front Side Coating: Conductive Pt/ Ir Back Side Coating: Reflective Pt/ Ir
RFESP-75 40 N/m the RTESPA-300-30 provides accurate nanomechanical3N m, 75kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingModeimaging and force modulation in air. Unmounted for use on standardAFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the
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