Multi75DLC Pin Mount SEM Specimen Holders 35 or 50nm Silicon Nitride

35 or 50nm Silicon Nitride Support Film

Veeco"s SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes

Pelcotec™ CDMS Critical Dimension Magnification Standard

Width x Thickness 5367-16NM PELCO® Pro High Precision

Enables imaging and analysis of clean

Multi75DLC Pin Mount SEM Specimen Holders 35 or 50nm Silicon NitrideDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius