Pay in 4 interest-free payments of $185.78 Learn more
Ships within 48 hours · Estimated delivery Sep 15 - Sep 20
***Note: Bruker's new MESP-V2 probe replaces the legacy MESP probe
Aluminum reflective coating on the backside of the cantilever
electrically conductive tip
these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
MultiMode 8
CDR50S PeakForce Tapping Enabled Bruker AFMProbes ***Note: Bruker's new MESP-V2 probeRound Re Entrant Tips for 3 D imaging Max W = 50 nm, Max OH = 8 nm, Max EL = 260 nm DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Re Entrant Tips for 3 D imaging Max Width = 50 nm Max Overhang = 8 nm Max Effective Length = 260 nm Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Set Back( RNG): 5 15 The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2. 5 times.
US$ 18.98
US$ 20.98
US$ 44.00
US$ 14.99
US$ 35.00
US$ 329.17
US$ 59.24
US$ 180.50
US$ 125.33
US$ 191.15
