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Ships within 48 hours · Estimated delivery Sep 21 - Sep 26
25 Cantilever Thickness (RNG): 0
Refer to calibration certificate for actual pitch
-110V) but available as a spare part
One cartridge for IRIS STM TERS
SEM image of copper FIB lift-out TEM grid narrow posts showing set-back and shape
HS-Series AFM Calibration Standards Wire Cutting 25 Cantilever Thickness (RNG): 0DESCRIPTION Step heights of 20, 100 or 500nm. The HS series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z axis calibration the standards also offer X and Y axis calibration for bigger scanners in the 40 100um range. The structure symmetry enables calibration without the need to rotate and re align the sample in between x and Y axis calibration. The HS series feature silicon dioxide
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