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This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2
NanoTA probes for Dimension SPMs
This cost-effective probe has a nominal tip radius of 35 nm for excellent lateral resolution for MFM
since there is little to no lateral friction on the sample
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
SCANASYST-AIR-HR Vx & UVx This AFM probe is unmountedSharpened, 1 lever, 0. 4N m, Al Reflex coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS ScanAsyst Air HR probes are specifically designed for use with the ScanAsyst HR fast scanning accessory on the MultiMode 8 AFM. Enjoy up to 20X faster survey scan rates and up to 6X faster scans with no loss of resolution. This remarkable development leverages Brukers exclusive ScanAsyst Self Optimizing Atomic Force Microscopy Imaging Mode, which
