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LTESPA-V2 55 kHz Calibration Artifact: 180nm Depth

SKU: 50815168308

4.5
USD266.22 USD289.22

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Description

Calibration Artifact: 180nm Depth

and to automatically make appropriate parameter adjustments

5 ± 2 Tip Radius (Nom): 8 Tip Radius (Max): 12 Tip Set Back (Nom): 9 Tip Set Back( RNG): 7 - 12

These splash guards hold and seal the cantilever holder and seal on the end of a close-loop Dimension Hybrid XYZ SPM head

Quantity=10

LTESPA-V2 55 kHz Calibration Artifact: 180nm Depth48N m, 190kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality long lever etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, LTESP LTESPA AFM probes. Brukers new line of LTESP high quality premium etched silicon probes set the industry standard for long

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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