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fine and curved points
Made of vacuum grade aluminum to fit on the Hitachi S-3700N SEM
Center and Rim-Mark
low thermal linear expansion coefficient
Transmission 60%
Planotec Silicon Calibration Specimen - 10µm Pitch Mount:Mount D fine and curved pointsDESCRIPTION Useful for magnification calibration or image distortion check in SEM and LM. Single crystal silicon, 5mm x 5mm. The squares repeat every 10m (0. 01mm). The dividing lines are about 1. 9m wide, formed by electron beam lithography. A broader marking line is written every 500m (0. 5mm) which is useful for light microscopy. Lines are etched, and approximately 300nm deep. Available unmounted or mounted on SEM specimen mounts. A certificate of
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