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the SPS test specimen has been coated with a thin layer of carbon
Max Overhang = 8 nm
This is used with the NanoScope tip-evaluation software
and a short service life
S-4700 and S-3600N SEMs 45° Pin Mount and 90° Profile
PEAKFORCE-SECM Carbon Fiber the SPS test specimen hasPeakForce Scanning Electro Chemical Microscopy (SECM) Probe Kit DESCRIPTION KIT, PFSECM PROBES W GLOVES TWEEZERS PeakForce Scanning Electro Chemical Microscopy (SECM) Probe Kit Includes five (5) batch produced nanoelectrode probes Includes Teflon coated tweezers for proper probe handling Includes two (2) boxes of 20 disposible ESD gloves REQUIRES Dimension AFM, PeakForce SECM Accessory and ICONEC series cell to operate
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