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- Automatic image optimization for faster
Gold Coated Microscope Slide and Coverslips
End radii are controlled to 30nm +/- 15%
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model TESPA-V2
91mm) with a range of 0
APSH-0040 CPII - Automatic image optimization forCross Sectional Sample Holder DESCRIPTION The Cross Sectional Sample Holder, 0. 75" in diameter and 0. 26" tall, is used when the cross sectional surface of a sample is to be scanned. The cross sectional sample holder is included in the Scanning Capacitance Microscopy (SCM) option for Innova and CP II (Model PSSC 0100), but it is useful for Caliber and Dimension SPMs.
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