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150 micron length
as encountered on semiconductor samples and optics
For a calibrated version of this probe please see CLFC-NOBO
IC devices and so on
n-type staircase (SSRM-SMPL-N) and p-type staircase (SSRM-SMPL-P) also available separately
SCM-PTSI 20 nm 150 micron length2. 8N m, 75kHz, 4 Sided Tip, Conductive PtSi Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker SCM PtSi Probes For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its
