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and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs
the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
4" wafer precut into 20 x 30mm chips approximately 6 chips/wafer
Precision cutting tweezers for fine wire in electronics and thin film research
soda lime glass
Maxtaform Style H7 TipChecker and Surface Potential Microscopy (SPoM)DESCRIPTION Maxtaform Style H7 Mesh: 400 Pitch: 63 microns Hole: 51 microns Bar Width: 12 microns Transmission: 65% Maxtaform Reference Finder Grids, Style H7, 400 mesh, Copper, 100 vial Maxtaform Reference Finder Grids, Style H7, 400 mesh, Nickel, 100 vial Reference Finder Grids for Transmission Electron Microscopy A selection of TEM grids with reference patterns to enable relocating a particular grid area. Theses grids are known as reference,
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