Pay in 4 interest-free payments of $70.37 Learn more
Ships within 48 hours · Estimated delivery Sep 19 - Sep 24
The fabrication process ensures excellent uniformity of the structures across the chip
Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods
16 N/m nominal
Transfer Atomic Force Microscopy Discs from Diskpenser to PELCO® AFM Workstation to Microscope and to PELCO® AFM Disc Carrier or AFM Disc Storage Box with ease
center-marked
SiC-STEP Calibration Samples 300 Mesh The fabrication process ensures excellentDESCRIPTION 6H SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval. The simplicity of calibration of the calibration process is provided by the nearly uniform distribution of half monolayer high steps (either 0. 75 or 1. 5nm) on the sample surface demonstrating both chemical and mechanical stability. The step height corresponds to the half of the
US$ 10999.50
US$ 13999.50
US$ 8749.50
