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RFESPA-75 Caliber PLEASE NOTE: Sample cross-sectioning by

SKU: 71571671407

4.1
USD293.08 USD313.08

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Ships within 48 hours · Estimated delivery Sep 15 - Sep 20

Description

PLEASE NOTE: Sample cross-sectioning by cleaving or polishing is required

SPM cross-sectional sample holder for all Veeco SPMs

Included with the Dimension Series AFMs

and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs

It brings EBD´skey strength: precise tip orientation

RFESPA-75 Caliber PLEASE NOTE: Sample cross-sectioning by3N m, 75kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingModeimaging and force modulation in air. Unmounted for use on standardAFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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