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The structure symmetry enables calibration without the need to rotate and re-align the sample in between x- and Y-axis calibration
Packaging: Standard Cu grids 100grids/vial
nanoIR and afm+ systems
Each unmounted probe comes with four different cantilevers of various dimensions
Standard sample for Piezoresponse Force Microscopy
PELCO® 15nm Silicon Nitride Support Films for TEM Window(s):0.25 x 0.25mm The structure symmetry enables calibrationDESCRIPTION PRODUCT SPECIFICATIONS 15nm membrane thickness 200m frame thickness 21560 10 21568 10 21569 10 Silicon Nitride Support Film, 15nm with 0. 25 x 0. 25mm Window Silicon Nitride Support Film, 15nm with 2 each 0. 1 x 1. 5mm Windows Silicon Nitride Support Film, 15nm with 9 each 0. 1 x 0. 1mm Windows pkg 10 pkg 10 pkg 10 Defining parameters for the PELCO Silicon Nitride Support Films are: Film Thickness: Resilient, ultra low stress 8, 15, 35 or
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