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determination of lateral and vertical scanner nonlinearity
but where high conductivity is required
Accurate to ±1nm
as encountered on semiconductor samples and optics
lateral force microscopy
PELCO® 150 Mesh Grids s-SNOM Probes determination of lateral and verticalDESCRIPTION SIZE SPECIFICATIONS 150: Pitch 169m; Hole Width 125m; Bar Width 44m; Transmission 60% PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Copper, 100 vial PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Nickel, 100 vial PELCO Center Marked Grids, 150 mesh, 3. 0mm O. D., Gold, 25 vial, 25 vial Tabbed PELCO Tabbed Center Marked Grids, 150 mesh, 3. 0mm O. D., Copper, 100 vial PELCO Tabbed Center Marked Grids, 150 mesh, 3. 0mm O. D., Nickel,
US$ 160.00
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US$ 190.08
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