Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts Tip-evaluation software provides on-command "worst

Tip-evaluation software provides on-command "worst case" probe-shape diagnosis based on scanning of this roughness sample

For a less expensive uncalibrated version of this probe

2500nm tall spike with 30nm end radius and 150nm base width

The soft foam grip greatly improves handling of sensitive parts

No need for warm up or cool down

Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts Tip-evaluation software provides on-command "worstDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard