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This next-generation probe holder is directly driven by a small piezo in the holder for improved ease of use in TappingMode with lower driving power
This holder supports Electrostatic Force Microscopy (EFM)
8N/m Cantilever Thickness (Nom): 3 Cantilever Thickness (RNG): 2
5mm square and is unmounted
5 Side Angle: 20 ± 2
PFKPFM-SMPL 20 kHz This next-generation probe holder isSample to demonstrate imaging work function differences for KPFM. DESCRIPTION A sample to demonstrate imaging of work function differences for KPFM. This silicon sample specifically includes islands of aluminum and gold thereby enabling one to show surface potential contrast. Mounted on 15mm steel disk.
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