RTESPA-300 80 nm Other applications of the DDESP-FM-V2

Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM)

Max W = 50 nm

The DDLTESP-V2 probe provides:

Built on the high-performance RFESP-75 AFM probe

Cantilever Material: Silicon Cantilever Thickness (Nom): 2 Cantilever Geometry: Rectangular Cantilevers Number: 1

RTESPA-300 80 nm Other applications of the DDESP-FM-V240N m, 300kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode andother non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the most